Rapid and non-destructive method for measuring elemental composition and layer thickness.

Panalytical X'Pert Pro MPD system is equipped with a PixCel® high speed/resolution Si strip detector for performing rapid powder crystallography and micro-diffraction.

X-ray Diffraction (XRD) being used to identify and quantify metal carbide phases formed in Stellite hardfacing alloys fabricated using various processes.