We provide a full suite of advanced materials characterization techniques and provide the expertise to interpret the results and deliver recommendations.

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Metallography
Westinghouse has state-of-the-art laboratories & extensive capabilities for metallographic & ceramographic specimen preparation. These laboratories provide expert specimen preparation of challenging materials including radiological and non radiological specimens from sectioning, plating, mounting, grinding and polishing to etching and electro polishing capabilities.
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Optical Microscopy
We maintain well equipped laboratories for both radiological and non radiological materials. Our capabilities range from traditional metallography to automated 3D surface topographic imaging and laser confocal microscopy for surface profilometry.
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X-ray Characterization
Westinghouse has advanced, high throughput instrumentation for both compositional and structural characterization of radiological and non-radiological materials. Our X-ray fluorescence instrumentation can non-destructively identify alloys and perform compositional analysis as well as perform coating thickness measurements. Our X-ray diffractometer has the capability to evaluate high throughput powder and polycrystalline sample diffraction coupled with Phase ID and quantification, as well as capabilities for precision micro diffraction, thin film analysis and stress analysis.
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Electron Microscopy
We have state of the art electron microscopy instrumentation for detailed topographic, compositional and structural materials characterization. Our capabilities include:
  • Scanning Electron Microscopy (SEM) equipped with X-ray Energy Dispersive Spectroscopy (XEDS) at high and low vacuum modes
  • Dual beam instruments with focused ion beam (FIB) and SEM, operated at high and low vacuum modes, equipped with XEDS and EBSD, with in situ and ex situ sample lift-out capabilities, used for both radiological and non-radiological samples.
  • Scanning/Transmission Electron Microscope with FEG source equipped with XEDS used for both radiological and non-radiological specimens, and capability to make specimens using traditional foil techniques or FIB specimen preparation  
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